Compositional analysis of molecular beam epitaxy grown InyGa1−yAs/GaAs/AlxGa1−xAs quantum wells by determination of film thickness
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.352889
Reference13 articles.
1. Role of strain and growth conditions on the growth front profile of InxGa1−xAs on GaAs during the pseudomorphic growth regime
2. Relaxation of strain within multilayer InGaAs/GaAs pseudomorphic structures
3. A new secondary ion mass spectrometry technique for III‐V semiconductor compounds using the molecular ions CsM+
4. Interfacial properties of (Al,Ga)As/GaAs structures: Effect of substrate temperature during growth by molecular beam epitaxy
5. The interfacial morphology of strained epitaxial InxGa1−xAs/GaAs
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1. Output power enhancement of 100% for quaternary GaInAsSb/AlGaAsSb semiconductor disc lasers grown with a sequential growth scheme;Journal of Crystal Growth;2009-08
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