High performance germanium N+∕P and P+∕N junction diodes formed at low Temperature (⩽380°C) using metal-induced dopant activation
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3025849
Reference7 articles.
1. Solid Solubilities of Impurity Elements in Germanium and Silicon*
2. C. O. Chui and K. C. Saraswat, Germanium-Based Technologies; From Materials to Devices (Elsevier Science, Amsterdam, 2007), p. 173.
3. Self-Aligned n-Channel Germanium MOSFETs With a Thin Ge Oxynitride Gate Dielectric and Tungsten Gate
4. Self-nucleation free and dimension dependent metal-induced lateral crystallization of amorphous germanium for single crystalline germanium growth on insulating substrate
5. Low‐temperature dopant activation and its application to polycrystalline silicon thin film transistors
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