In situ x-ray diffraction study of metal induced crystallization of amorphous germanium
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3110722
Reference29 articles.
1. Influence of interface and Al structure on layer exchange during aluminum-induced crystallization of amorphous silicon
2. Nickel induced crystallization of amorphous silicon thin films
3. Thin film reaction of transition metals with germanium
4. Metal-contact-induced crystallization of semiconductors
5. Temperature dependent metal-induced lateral crystallization of amorphous SiGe on insulating substrate
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