Static and dynamic buckling of reconstructions at triple steps on Si(111) surfaces-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Static and dynamic buckling of reconstructions at triple steps on Si(111) surfaces

Published:2014-10-27 Issue:17 Volume:105 Page:171602
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Zhachuk R.¹,Teys S.¹,Coutinho J.²,Rayson M. J.³,Briddon P. R.⁴

Affiliation:

1. Institute of Semiconductor Physics, pr. Lavrentyeva 13, Novosibirsk 630090, Russia

2. Department of Physics & I3N, University of Aveiro, Campus Santiago, 3810-193 Aveiro, Portugal

3. Department of Chemistry, University of Surrey, Guildford GU2 7XH, United Kingdom

4. School of Electrical, Electronic and Computer Engineering, Newcastle University, Newcastle Upon Tyne NE1 7RU, United Kingdom

Funder

FundaÃ§Ã£o para a CiÃªncia e a Tecnologia

Russian Foundation for Basic Research (RFBR)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4900783

Reference26 articles.

1. Step-height-tripling transition on vicinal Si(111)

2. Step-height mixtures on vicinal Si(111) surfaces

3. Atomically accurate Si grating with 5.73 nm period

4. Coupled Pb Chains on Si(557): Origin of One-Dimensional Conductance

5. Formation of ordered arrays of Ag nanowires and nanodots on Si(557) surface

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comment on “Experimental Evidence for a New Two-Dimensional Honeycomb Phase of Silicon: A Missing Link in the Chemistry and Physics of Silicon Surfaces?”;The Journal of Physical Chemistry C;2021-12-28

2. Steps and Ge epitaxy on vicinal Si (111) surfaces: An STM study;Surface Science;2020-06

3. TPD characterization of Al-OD-Si sites at the interface of bilayer Al0.42Si0.58O2/Ru(0001) thin-films.;Surface Science;2020-06

4. Atomic structure of high Miller index Si(47 35 7) surface;Surface Science;2020-03

5. Magnification Effects in Scanning Tunneling Microscopy: the Role of Surface Radicals;Journal of Experimental and Theoretical Physics;2019-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3