TPD characterization of Al-OD-Si sites at the interface of bilayer Al0.42Si0.58O2/Ru(0001) thin-films.
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Published:2020-06
Issue:
Volume:696
Page:121595
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ISSN:0039-6028
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Container-title:Surface Science
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language:en
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Short-container-title:Surface Science
Author:
Dhar Bijoya,Pollock Joshua,Gloria Jillian,Kaden William E.
Funder
Solar System Exploration Research Virtual Institute
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
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