Metrological large range scanning probe microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1651638
Reference11 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Atomic Force Microscope
3. Industrial Uses of STM and AFM * *Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources.
4. Design and three dimensional calibration of a measuring scanning tunneling microscope for metrological applications
5. Real-time, interferometrically measuring atomic force microscope for direct calibration of standards
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