Quantitative Evaluation of the Batwing Effect on Depth Measurement in Coherence Scanning Interferometry for Rectangular Gratings

Author:

Zhang Jiale1,Yuan Qun1,Fan Xiaoxin1,Chen Lu2,Lei Lihua3,Fu Yunxia3,Xu Zhiyi1,Ma Jianqiu1,Gao Zhishan1

Affiliation:

1. School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China

2. Jiangsu Institute of Metrology, Nanjing 210023, China

3. Shanghai Key Laboratory of Online Test and Control Technology, Shanghai 201203, China

Abstract

Coherence scanning interferometry (CSI) is a widely used non-contact method for measuring areal surface topography. The calculation of groove depth typically employs the ‘W/3 rule’ specified in ISO 5436-1. However, the batwing effect causes overshoots near the groove edges, which can introduce noise singularities in the selected W/3 region for depth calculation, thereby affecting the measurement of rectangular grating depth. This paper introduces the definition of batwing height and width and proposes a simulation model that considers various factors, such as the center wavelength, spectrum of the illuminating light, shadow effect, and numerical aperture, to analyze their influence on depth measurement. The simulation results demonstrate that the batwing width is the primary factor influencing depth measurement for small grating periods. Specifically, a decrease in numerical aperture increases the batwing width, leading to larger depth measurement errors, while a decrease in the center wavelength reduces the batwing width, resulting in smaller depth measurement errors. The influence of the illumination spectrum and shadow effect on depth measurement is found to be minor. Experimental validation using a step standard consisting of rectangular gratings with different periods and depths confirms the agreement between the experimental and simulated results. The proposed method provides a quantitative evaluation of depth measurement accuracy in CSI.

Funder

National Natural Science Foundation of China

National Key Research and Development Program

Shanghai Natural Science Foundation

Program of Shanghai Academic/Technology Research Leader

China Postdoctoral Science Foundation

Jiangsu Funding Program for Excellent Postdoctoral Talent

State Administration for Market Regulation Science and Technology Program

Publisher

MDPI AG

Reference26 articles.

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