Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4870710
Reference15 articles.
1. High‐resolution capacitance measurement and potentiometry by force microscopy
2. Kelvin probe force microscopy
3. Controlling Energy-Level Alignments at Carbon Nanotube/Au Contacts
4. Method to assess the grain crystallographic orientation with a submicronic spatial resolution using Kelvin probe force microscope
5. Surface potential of n- and p-type GaN measured by Kelvin force microscopy
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