Surface potential of n- and p-type GaN measured by Kelvin force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3028639
Reference14 articles.
1. Thermal Annealing Effects on P-Type Mg-Doped GaN Films
2. Scanning Kelvin probe microscopy characterization of dislocations in III-nitrides grown by metalorganic chemical vapor deposition
3. Scanning Kelvin probe microscopy of surface electronic structure in GaN grown by hydride vapor phase epitaxy
4. Surface morphology and electronic properties of dislocations in AlGaN/GaN heterostructures
5. Scanning Kelvin force microscopy imaging of surface potential variations near threading dislocations in GaN
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