Dark field electron holography for quantitative strain measurements with nanometer-scale spatial resolution
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3196549
Reference14 articles.
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3. Measurements of alloy composition and strain in thin GexSi1−xlayers
4. Strain dependence of Si–Ge interdiffusion in epitaxial Si∕Si1−yGey∕Si heterostructures on relaxed Si1−xGex substrates
5. Quantitative measurement of displacement and strain fields from HREM micrographs
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