Measurement of residual elastic strain in rolled-up amorphous nanomembranes using nanobeam electron diffraction

Author:

Zheng Zhi1ORCID,Liu Chang1ORCID,He Wenhao2ORCID,Huang Jiayuan1ORCID,He Jiachuo2ORCID,Huang Gaoshan134ORCID,Mei Yongfeng1345ORCID,Zheng Changlin2ORCID

Affiliation:

1. Department of Materials Science & State Key Laboratory of Molecular Engineering of Polymers, Fudan University 1 , Shanghai 200438, People's Republic of China

2. Department of Physics & State Key Laboratory of Surface Physics, Fudan University 2 , Shanghai 200438, People's Republic of China

3. Yiwu Research Institute of Fudan University 3 , Yiwu, Zhejiang 322000, People's Republic of China

4. International Institute of Intelligent Nanorobots and Nanosystems, Fudan University 4 , Shanghai 200438, People's Republic of China

5. Shanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, Fudan University 5 , Shanghai 200438, People's Republic of China

Abstract

Amorphous nanomembranes play a crucial role in flexible electronics due to their ability to create intricate 3D structures through strain engineering. To better understand the formation of these structures, accurately mapping the local elastic strain distribution is essential. In this study, we conducted position-sensitive nanobeam electron diffraction investigations on various rolled-up amorphous nanomembranes. By analyzing the diffraction rings obtained from different locations on the amorphous samples, we extracted anisotropic structure information in reciprocal space and determined the local strain distributions in real space. Our analysis revealed that particle-assisted dry-released samples exhibited higher strain values than pure amorphous samples. This suggests that nanoparticles introduce additional strain through dewetting effects, thereby facilitating the formation of self-rolling 3D structures.

Funder

National Natural Science Foundation of China

Key Technologies Research and Development Program

Science and Technology Commission of Shanghai Municipality

Publisher

AIP Publishing

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