Time series statistical analysis: A powerful tool to evaluate the variability of resistive switching memories-Reference-Cited by-同舟云学术

Time series statistical analysis: A powerful tool to evaluate the variability of resistive switching memories

Published:2019-05-07 Issue:17 Volume:125 Page:174504
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Roldán J. B.¹^ORCID,Alonso F. J.²^ORCID,Aguilera A. M.²^ORCID,Maldonado D.¹,Lanza M.³^ORCID

Affiliation:

1. Departamento de Electrónica y Tecnología de Computadores, Universidad de Granada, Facultad de Ciencias, Avd. Fuentenueva s/n, 18071 Granada, Spain

2. Departamento de Estadística e Investigación Operativa, Universidad de Granada, Facultad de Ciencias, Avd. Fuentenueva s/n, 18071 Granada, Spain

3. Institute of Functional Nano and Soft Materials (FUNSOM), Collaborative Innovation Center of Suzhou Nanoscience & Technology, Soochow University, 199 Ren-Ai Road, Suzhou 215123, China

Funder

Ministerio

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5079409

Reference39 articles.

1. Recent progress in resistive random access memories: Materials, switching mechanisms, and performance

2. Nanoionics-based resistive switching memories

3. Resistive switching in hafnium dioxide layers: Local phenomenon at grain boundaries

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