Electrostatic force microscopy of silver nanocrystals with nanometer-scale resolution
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.119425
Reference8 articles.
1. High‐resolution capacitance measurement and potentiometry by force microscopy
2. Deposition and imaging of localized charge on insulator surfaces using a force microscope
3. Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions
4. Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes
5. Formation and observation of 50 nm polarized domains in PbZr1−xTixO3 thin film using scanning probe microscope
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