Charging C60 islands with the AFM tip
Author:
Affiliation:
1. CNRS
2. Aix-Marseille University
3. CINaM UMR 7325
4. 13288 Marseille Cedex 09, France
Abstract
We show that noncontact AFM (nc-AFM) and electrostatic force microscopy (EFM) can be used to transfer electrons on demand from the AFM tip into single bulk-like C60 islands, which are supported on the insulating NaCl(001) surface. Kelvin probe force microscopy (KPFM) helps to characterize the charge in C60 islands and their interaction with the NaCl support.
Funder
Agence Nationale de la Recherche
Publisher
Royal Society of Chemistry (RSC)
Subject
General Materials Science
Link
http://pubs.rsc.org/en/content/articlepdf/2016/NR/C5NR04541J
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