Multi-domain high-resolution platform for integrated spectroscopy and microscopy characterizations-Reference-Cited by-同舟云学术

Multi-domain high-resolution platform for integrated spectroscopy and microscopy characterizations

Published:2020-12 Issue:6 Volume:33 Page:680-685
ISSN:1674-0068
Container-title:Chinese Journal of Chemical Physics
language:en
Short-container-title:Chinese Journal of Chemical Physics

Author:

Wang Li¹,Jiang Shen-long¹,Zhang Qun¹,Luo Yi¹

Affiliation:

1. Hefei National Laboratory for Physical Sciences at the Microscale, Department of Chemical Physics, Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry

Link

http://cps.scitation.org/doi/pdf/10.1063/1674-0068/cjcp2006093

Reference25 articles.

1. Aligned, high-density semiconducting carbon nanotube arrays for high-performance electronics

2. Unconventional superconductivity in magic-angle graphene superlattices

3. Terahertz imaging with nanometer resolution

4. AFM-IR and IR-SNOM for the Characterization of Small Molecule Organic Semiconductors

5. Femtosecond time-resolved spectroscopic photoemission electron microscopy for probing ultrafast carrier dynamics in heterojunctions

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