AFM-IR and IR-SNOM for the Characterization of Small Molecule Organic Semiconductors-Reference-Cited by-同舟云学术

AFM-IR and IR-SNOM for the Characterization of Small Molecule Organic Semiconductors

Published:2020-02-11 Issue:9 Volume:124 Page:5331-5344
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Rao Vaishnavi J.¹²,Matthiesen Maik¹²,Goetz Katelyn P.¹²,Huck Christian²³^ORCID,Yim Chanyoung⁴,Siris Rita⁴,Han Jie⁵,Hahn Sebastian⁶,Bunz Uwe H. F.²⁶,Dreuw Andreas⁵^ORCID,Duesberg Georg S.⁴^ORCID,Pucci Annemarie²³^ORCID,Zaumseil Jana¹²^ORCID

Affiliation:

1. Institute of Physical Chemistry, Universität Heidelberg, D-69120 Heidelberg, Germany

2. Centre for Advanced Materials, Universität Heidelberg, D-69120 Heidelberg, Germany

3. Kirchhoff-Institute of Physics, Universität Heidelberg, D-69120 Heidelberg, Germany

4. Institute of Physics, EIT 2, Universität der Bundeswehr München, 85577 Neubiberg, Germany

5. Interdisciplinary Center for Scientific Computing, Universität Heidelberg, D-69120 Heidelberg, Germany

6. Institute of Organic Chemistry, Universität Heidelberg, D-69120 Heidelberg, Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.9b11056

Reference47 articles.

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3. Infrared Imaging and Spectroscopy Beyond the Diffraction Limit

4. Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

5. Analysis of nano-chemical mapping performed by an AFM-based (“AFMIR”) acousto-optic technique

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