Recent Progress and Applications of NanoIR‐AFM in Morphological Characterization of Organic Solar Cells

Abstract

AbstractOrganic solar cells (OSCs) are gaining attention in building‐integrated and agricultural photovoltaics due to their light weight, mechanical flexibility, and low‐cost solution processability. To achieve commercial viability, understanding the relationships between active layer material structure, film morphology, and photovoltaic performance is crucial. Nanoscale infrared spectroscopy coupled with atomic force microscopy (nanoIR‐AFM) offers an advanced characterization of active layer morphology at high resolution to help understand OSC performance. This review outlines recent developments and applications of nanoIR‐AFM in OSC research, detailing its principles, instruments, and functions. Strategies to enhance OSC performance and their morphological characterization by nanoIR‐AFM are discussed, offering insights into active layer evolution and device performance. The review highlights challenges faced by nanoIR‐AFM in OSC applications and highlights its potential role in advancing OSC technology. As nanoIR‐AFM continues to evolve, it will play a critical role in OSC development, providing essential technical means for further progress.