Femtosecond time-resolved spectroscopic photoemission electron microscopy for probing ultrafast carrier dynamics in heterojunctions-Reference-Cited by-同舟云学术

Femtosecond time-resolved spectroscopic photoemission electron microscopy for probing ultrafast carrier dynamics in heterojunctions

Published:2019-08 Issue:4 Volume:32 Page:399-405
ISSN:1674-0068
Container-title:Chinese Journal of Chemical Physics
language:en
Short-container-title:Chinese Journal of Chemical Physics

Author:

Li Bo-han¹²,Zhang Guan-hua¹,Liang Yu¹³,Hao Qun-qing¹,Sun Ju-long¹,Zhou Chuan-yao¹,Tao You-tian³,Yang Xue-ming¹⁴,Ren Ze-feng¹

Affiliation:

1. State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China

2. University of Chinese Academy of Sciences, Beijing 100049, China

3. Key Laboratory of Flexible Electronics (KLOFE) & Institute of Advanced Materials (IAM), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing Tech University, Nanjing 211816, China

4. Department of Chemistry, Southern University of Science and Technology, Shenzhen 518055, China

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry

Link

http://cps.scitation.org/doi/pdf/10.1063/1674-0068/cjcp1903044

Reference34 articles.

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5. Transport Properties of a MoS2/WSe2 Heterojunction Transistor and Its Potential for Application

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