Depth profiling using the glancing‐incidence and glancing‐takeoff x‐ray fluorescence method
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1146163
Reference21 articles.
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2. Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence;Journal of Analytical Atomic Spectrometry;2015
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4. X-RAY FLUORESCENCE AND EMISSION | Total Reflection X-Ray Fluorescence;Encyclopedia of Analytical Science;2005
5. Feasibility study of three-dimensional XRF spectrometry using μ-X-ray beams under grazing-exit conditions;Spectrochimica Acta Part B: Atomic Spectroscopy;2003-12
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