Scanning-free grazing emission x-ray fluorescence by means of an angular dispersive arrangement with a two-dimensional position-sensitive area detector-Reference-Cited by-同舟云学术

Scanning-free grazing emission x-ray fluorescence by means of an angular dispersive arrangement with a two-dimensional position-sensitive area detector

Published:2013-12 Issue:12 Volume:84 Page:123102
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Kayser Y.,Szlachetko J.,Sà J.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4838575

Reference37 articles.

1. Total reflection X-ray fluorescence analysis: Physical foundations and analytical application (A review)

2. Synchrotron radiation-induced total reflection X-ray fluorescence analysis

3. Total reflection X-ray fluorescence and grazing incidence X-ray spectrometry — Tools for micro- and surface analysis. A review

4. Total reflection x-ray fluorescence analysis—a review

5. Review on grazing incidence X-ray spectrometry and reflectometry

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Exploring the Depths of Corrosion: A Novel GE-XANES Technique for Investigating Compositionally Complex Alloys;Analytical Chemistry;2023-03-03

2. Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples;Nanomaterials;2022-10-26

3. Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces;Nanoscale;2022

4. Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures;Small;2021-11-25

5. A compact and efficient angle-resolved X-ray fluorescence spectrometer for elemental depth profiling;Spectrochimica Acta Part B: Atomic Spectroscopy;2021-07