Tip–sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1150629
Reference11 articles.
1. Scanning tip microwave near‐field microscope
2. Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope
3. High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope
4. Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains
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