Evanescent microwave probe study on dielectric properties of materials
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Ceramics and Composites
Reference9 articles.
1. Infrared near-field imaging of implanted semiconductors: evidence of a pure dielectric contrast;Lahrech;Appl. Phys. Lett.,1997
2. Nondestructive imaging of dielectric-constant profiles and ferroelectric domains with a scanning-tip microwave near-field microscope;Lu;Science,1997
3. Low temperature scanning-tip microwave near-field microscopy of YBCO films;Takeuchi;Appl. Phys. Lett.,1997
4. Quantitative microwave evanscent microscopy;Gao;Appl. Phys. Lett.,1999
5. Tip-sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging;Duewer;Rev. Sci. Instrum.,2000
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