Kinematical simulation of high‐resolution x‐ray diffraction curves of GexSi1−x/Si strained‐layer superlattices: A structural assessment
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.99189
Reference18 articles.
1. Indirect band gap of coherently strainedGexSi1−xbulk alloys on〈001〉silicon substrates
2. Measurement of the band gap of GexSi1−x/Si strained‐layer heterostructures
3. Modulation doping in GexSi1−x/Si strained layer heterostructures
4. GexSi1−xstrained‐layer superlattice waveguide photodetectors operating near 1.3 μm
5. Observation of Order-Disorder Transitions in Strained-Semiconductor Systems
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