Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy
Author:
Affiliation:
1. CEMES, CNRS, 29 rue Jeanne Marvig, 31055 Toulouse, France
2. Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/am-pdf/10.1063/1.4975114
Reference32 articles.
1. A review of focused ion beam milling techniques for TEM specimen preparation
2. Application of the ionless tripod polisher to the preparation of YBCO superconducting multilayer and bulk ceramics thin films
3. Small-angle cleavage of semiconductors for transmission electron microscopy
4. Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling
5. TEM Sample Preparation and FIB-Induced Damage
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