Low damage lamella preparation of metallic materials by FIB processing with low acceleration voltage and a low incident angle Ar ion milling finish-Reference-Cited by-同舟云学术

Low damage lamella preparation of metallic materials by FIB processing with low acceleration voltage and a low incident angle Ar ion milling finish

Published:2020-02-19 Issue:3 Volume:279 Page:234-241
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

SATO T.¹^ORCID,AIZAWA Y.¹,MATSUMOTO H.¹,KIYOHARA M.²,KAMIYA C.¹,VON CUBE F.³

Affiliation:

1. Hitachi High‐Technologies CorporationIchige Hitachinaka‐shi Ibaraki Japan

2. Hitachi High‐Tech Science CorporationTakenoshita Oyama‐cho Shizuoka Japan

3. Hitachi High‐Technologies Europe GmbHEuropark, Fichtenhain Krefeld Germany

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12878

Reference26 articles.

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4. Chung H.M.&Chopra O.K.(1987)Kinetics and mechanism of thermal aging embrittlement of duplex stainless steels. Proceedings of the 3rd International Symposium On Environmental Degradation of Materials in Nuclear Power Systems: Water Reactors 359–370.

5. Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy

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