Mechanistic analysis of temperature-dependent current conduction through thin tunnel oxide in n+-polySi/SiO2/n+-Si structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5000131
Reference32 articles.
1. Modeling of the intrinsic retention characteristics of FLOTOX EEPROM cells under elevated temperature conditions
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