Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction-Reference-Cited by-同舟云学术

Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

Author:

Romanyuk O.¹,Fernández-Garrido S.²,Jiříček P.¹,Bartoš I.¹^ORCID,Geelhaar L.²,Brandt O.²,Paskova T.³

Affiliation:

1. Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, 162 53 Prague, Czech Republic

2. Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5–7, D–10117 Berlin, Germany

3. Department of Electrical and Computer Engineering, North Carolina State University, Raleigh, North Carolina 27606, USA

Funder

National Science Foundation (NSF)

Akademie ved Ceské Republiky (Academy of Sciences of the Czech Republic)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

Reference34 articles.

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