Infrared studies of transition layers at SiO2/Si interface
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.368917
Reference28 articles.
1. SiO2 / Si Interface Structures and Reliability Characteristics
2. Structure and electronic states of ultrathin SiO2 thermally grown on Si(100) and Si(111) surfaces
3. Structural fluctuation of SiO2 network at the interface with Si
4. Structural nature of the Si/SiO2 interface through infrared spectroscopy
5. Chemical Bonds at and Near the SiO2/Si Interface
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