Sensitive contactless eddy‐current conductivity measurements on Si and HgCdTe-Reference-Cited by-同舟云学术

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Sensitive contactless eddy‐current conductivity measurements on Si and HgCdTe

Published:1989-06 Issue:6 Volume:60 Page:1116-1122
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Chen M. C.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1140326

Reference7 articles.

1. Contactless method of measuring resistivity

2. Contactless measurement of semiconductor conductivity by radio frequency‐free‐carrier power absorption

3. Contactless Measurement of Semiconductor Mobility, Conductivity and Carrier Concentration

4. Noncontact electrical characterization of epitaxial HgCdTe

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Conductivity Measurement;Characterization of Materials;2012-10-12

2. Contactless measurement of electrical conductivity of Si wafers independent of wafer thickness;Applied Physics Letters;2005-10-17

3. Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement;Review of Scientific Instruments;2005-08

4. A Method for Quantitative Evaluation of Electrical Conductivity of Silicon Wafers by Millimeter-Waves;Key Engineering Materials;2004-08

5. Contactless measurement of electrical conductivity of semiconductor wafers using the reflection of millimeter waves;Applied Physics Letters;2002-11-04

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