Contactless measurement of semiconductor conductivity by radio frequency‐free‐carrier power absorption
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1134756
Reference8 articles.
1. Resistivity Measurement of Semiconducting Epitaxial Layers by the Reflection of a Hyperfrequency Electromagnetic Wave
2. A precise cavity technique for measuring low resistivity semiconductors
3. Application of Microwave Reflection Technique to the Measurement of Transient and Quiescent Electrical Conductivity of Silicon
4. Conductivity Measurements of Semiconductors by Microwave Transmission Technique
5. Noncontact Technique for the Local Measurement of Semiconductor Resistivity
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