Dynamic model of trapping‐detrapping in SiO2
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.335942
Reference32 articles.
1. Optically induced injection of hot electrons into SiO2
2. Avalanche injection currents and trapping phenomena in thermal SiO2
3. AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2
4. Avalanche Injection of Electrons into Insulating SiO2 Using MOS Structures
5. Thermal reemission of trapped electrons in SiO2
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