Thermal reemission of trapped electrons in SiO2
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.324568
Reference28 articles.
1. Electron trapping at positively charged centers in SiO2
2. High‐field capture of electrons by Coulomb‐attractive centers in silicon dioxide
3. Electron trapping by radiation‐induced charge in MOS devices
4. Capture and emission of electrons at 2.4-eV-deep trap level in SiO2films
5. Photoemission of Electrons from Silicon into Silicon Dioxide
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