Capture and emission of electrons at 2.4-eV-deep trap level in SiO2films
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.11.5023/fulltext
Reference44 articles.
1. Spectrally resolved photo depopulation of electron trapping defects in amorphous silica films
2. Electron trapping levels in silicon dioxide thermally grown on silicon
3. Transient photodepopulation measurements of electron trap distributions in thin SiO2 films on silicon
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