Multiple coupled charge layers in electron beam induced charging phenomenon-Reference-Cited by-同舟云学术

Multiple coupled charge layers in electron beam induced charging phenomenon

Published:2020-07-14 Issue:2 Volume:128 Page:024902
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Li C.¹^ORCID,Li H. M.²,Ding Z. J.¹^ORCID

Affiliation:

1. Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China

2. Super Computation Center, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China

Funder

National Key Research and Development Project

Education Ministry through the "111" Project 2.0

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0006488

Reference55 articles.

1. Electron Probe Microanalysis of Insulating Materials: Quantification Problems and Some Possible Solutions

2. About the Mechanisms of Charging in EPMA, SEM, and ESEM with Their Time Evolution

3. On some contrast reversals in SEM: Application to metal/insulator systems

4. Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties

5. Determination of SiO2trapped charge distribution by capacitance‐voltage analysis of undoped polycrystalline silicon‐oxide‐silicon capacitors

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