1/f noise investigations in small channel length amorphous silicon thin film transistors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.366586
Reference12 articles.
1. Noise as a diagnostic tool for quality and reliability of electronic devices
2. Static and dynamic analysis of amorphous-silicon field-effect transistors
3. Theoretical Analysis of Amorphous-Silicon Field-Effect-Transistors
4. Unified presentation of 1/f noise in electron devices: fundamental 1/f noise sources
5. Reconciliation of different gate-voltage dependencies of 1/f noise in n-MOS and p-MOS transistors
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