Influence of Si precursor on Ge segregation during ultrathin Si reduced pressure chemical vapor deposition on Ge
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3280075
Reference13 articles.
1. Passivation of Ge(100)∕GeO[sub 2]∕high-κ Gate Stacks Using Thermal Oxide Treatments
2. Optimisation of a thin epitaxial Si layer as Ge passivation layer to demonstrate deep sub-micron n- and p-FETs on Ge-On-Insulator substrates
3. Strained Si films grown by chemical vapor deposition of trisilane on Ge buffered Si(100)
4. Epitaxial growth of Ge thick layers on nominal and 6° off Si(0 0 1); Ge surface passivation by Si
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3. Low-temperature grown single-crystal Si on epi Ge(001)-2 × 1 and its oxidation: electronic structure study via synchrotron radiation photoemission;Applied Physics Express;2020-07-08
4. Synthesis and Exploratory Deposition Studies of Isotetrasilane and Reactive Intermediates for Epitaxial Silicon;Inorganic Chemistry;2019-02-20
5. Abrupt SiGe-to-Si interface: influence of chemical vapor deposition processes and characterization by different metrology techniques;Semiconductor Science and Technology;2018-09-05
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