Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4871408
Reference22 articles.
1. XXXVIII.A suggested method for extending microscopic resolution into the ultra-microscopic region
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