Imaging of soft material with carbon nanotube tip using near-field scanning microwave microscopy-Reference-Cited by-同舟云学术

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Imaging of soft material with carbon nanotube tip using near-field scanning microwave microscopy

Published:2015-01 Issue: Volume:148 Page:75-80
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Wu Zhe,Sun Wei-qiang,Feng Tao,Tang Shawn Wenjie,Li Gang,Jiang Kai-li,Xu Sheng-yong,Ong Chong Kim

Funder

SERC

MOST of China

NSF of China

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Scanning tip microwave near-field microscope;Wei;Appl. Phys. Lett.,1996

2. High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope

3. Quantitative microwave near-field microscopy of dielectric properties;Gao;Rev. Sci. Instrum.,1998

4. High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope;Gao;Appl. Phys. Lett.,1997

5. Quantitative measurement of sheet resistance by evanescent microwave probe;Wang;Appl. Phys. Lett.,2005

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