Dynamic junction temperature measurement for high power light emitting diodes
Author:
Funder
Program for New Century Excellent Talents in University (China)
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3624699
Reference10 articles.
1. Temperature dependence of the E2 and A1(LO) phonons in GaN and AlN
2. Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods
3. In Situ Measurement of the Junction Temperature of Light Emitting Diodes Using a Flexible Micro Temperature Sensor
4. High power light-emitting diode junction temperature determination from current-voltage characteristics
5. Y. Q. Zong and Y. S. Ohno, in Proceedings of the CIE Expert Symposium on Advances in Photometry, Turin, Italy, June 9–12, 2008, CIE x033, p. 102.
Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Measuring the surface temperature of light-emitting diodes by thermoreflectance;Japanese Journal of Applied Physics;2021-05-01
2. Flexible temperature sensor fabrication using photolithography technique;Thermal Science and Engineering Progress;2021-05
3. Precise measurement of junction temperature by thermal analysis of light-emitting diode operated at high environmental temperature;Microelectronic Engineering;2021-01
4. Heat Dissipation in Flexible Nitride Nanowire Light-Emitting Diodes;Nanomaterials;2020-11-16
5. Analysis On Thermal Behaviour Of The Sink And Die Area With Different Thermal Interface Material For High Power Light Emitting Diodes;Light & Engineering;2020-10
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3