Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods-Reference-Cited by-同舟云学术

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Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods

Published:2005-01-17 Issue:3 Volume:86 Page:031907
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Xi Y.,Xi J.-Q.,Gessmann Th.,Shah J. M.,Kim J. K.,Schubert E. F.,Fischer A. J.,Crawford M. H.,Bogart K. H. A.,Allerman A. A.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1849838

Reference14 articles.

1. Room-temperature direct current operation of 290 nm light-emitting diodes with milliwatt power levels

2. High Output Power 365 nm Ultraviolet Light Emitting Diode of GaN-Free Structure

3. Micro-pixel Design Milliwatt Power 254 nm Emission Light Emitting Diodes

4. GaN microdisk light emitting diodes

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