Precise measurement of junction temperature by thermal analysis of light-emitting diode operated at high environmental temperature-Reference-Cited by-同舟云学术

Precise measurement of junction temperature by thermal analysis of light-emitting diode operated at high environmental temperature

Published:2021-01 Issue: Volume:235 Page:111451
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Choi Hyunjin,Wang Leilei,Kang Seok-Won^ORCID,Lim Jiseok,Choi Jungwook^ORCID

Funder

National Research Foundation of Korea

Ministry of Education

Ministry of Science, ICT and Future Planning

Korea Institute for Advancement of Technology

Korea Government

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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