Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4864086
Reference17 articles.
1. Atomic Force Microscope
2. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
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4. Calibration of rectangular atomic force microscope cantilevers
5. Nanoelectromechanical Systems
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