Calibration of atomic‐force microscope tips
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143970
Reference23 articles.
1. Atomic Force Microscope
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
3. Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope
4. Measurement of forces in liquids using a force microscope
5. Interaction forces between a tungsten tip and methylated SiO2 surfaces studied with scanning force microscopy
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