A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144209
Reference8 articles.
1. Atomic Force Microscope
2. Atomic Resolution with Atomic Force Microscope
3. Microfabrication of cantilever styli for the atomic force microscope
4. Measurement of forces between two mica surfaces in aqueous electrolyte solutions in the range 0–100 nm
5. Measurement of forces in liquids using a force microscope
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