Vanishing Cantilever Calibration Error with Magic Ratio Atomic Force Microscopy-Reference-Cited by-同舟云学术

Vanishing Cantilever Calibration Error with Magic Ratio Atomic Force Microscopy

Published:2020-06-22 Issue:8 Volume:3 Page:2000090
ISSN:2513-0390
Container-title:Advanced Theory and Simulations
language:en
Short-container-title:Adv. Theory Simul.

Author:

Sheridan Richard J.¹^ORCID,Collinson David W.¹,Brinson L. Catherine¹^ORCID

Affiliation:

1. Department of Mechanical Engineering and Materials SciencePratt School of EngineeringDuke University 144 Hudson Hall, PO Box 90330 Durham NC 27708 USA

Funder

Duke University

Division of Civil, Mechanical and Manufacturing Innovation

Air Force Office of Scientific Research

Publisher

Wiley

Subject

Multidisciplinary,Modelling and Simulation,Numerical Analysis,Statistics and Probability

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adts.202000090

Reference25 articles.

1. Probing Soft Matter with the Atomic Force Microscopies: Imaging and Force Spectroscopy

2. Probing of Polymer Surfaces in the Viscoelastic Regime

3. Imaging modes of atomic force microscopy for application in molecular and cell biology

4. The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation

5. Pulsed force mode: a new method for the investigation of surface properties

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