Ion‐assisted etching of silicon by SF6
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.95746
Reference14 articles.
1. Plasma etching—A discussion of mechanisms
2. Mass and energy distribution of particles sputter etched from Si in a XeF2environment
3. Argon‐ion assisted etching of silicon by molecular chlorine
4. Etch products from the reaction of XeF2 with SiO2, Si3N4, SiC, and Si in the presence of ion bombardment
5. Ion‐assisted etching of silicon by molecular chlorine
Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Comparison endpoint study of process plasma and secondary electron beam exciter optical emission spectroscopy;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2012-11
2. Numerical study of the plasma chemistry in inductively coupled SF6and SF6/Ar plasmas used for deep silicon etching applications;Journal of Physics D: Applied Physics;2011-10-13
3. Black silicon method: X. A review on high speed and selective plasma etching of silicon with profile control: an in-depth comparison between Bosch and cryostat DRIE processes as a roadmap to next generation equipment;Journal of Micromechanics and Microengineering;2009-02-02
4. Structure of surface reaction layer of poly-Si etched by fluorocarbon plasma;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2006-03
5. Measurements of desorbed products by plasma beam irradiation on SiO2;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2004-11
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3