Degradation and subsequent healing by electromigration in Al‐1 wt % Si thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.351653
Reference26 articles.
1. Electromigration—A brief survey and some recent results
2. Electromigration in conductor stripes under pulsed dc powering
3. Study of electromigration‐induced resistance and resistance decay in Al thin‐film conductors
4. On the electromigration failure under pulsed conditions
5. Electromigration Failure in A1 Thin Films under Constant and Reversed DC Powering
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