Electromigration in conductor stripes under pulsed dc powering
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1654428
Reference4 articles.
1. Electromigration and failure in electronics: An introduction
2. Time-dependent void nucleation during electromigration
3. Void Formation and Growth During Electromigration in Thin Films
4. Annealing kinetics of voids and the Self-diffusion coefficient in aluminum
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