Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers
Author:
Affiliation:
1. Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
2. Maryland Nanocenter, University of Maryland, College Park, Maryland 20742, USA
Funder
University of Maryland
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://scitation.aip.org/deliver/fulltext/aip/journal/rsi/86/7/1.4926431.pdf?itemId=/content/aip/journal/rsi/86/7/10.1063/1.4926431&mimeType=pdf&containerItemId=content/aip/journal/rsi
Reference33 articles.
1. A new force controlled atomic force microscope for use in ultrahigh vacuum
2. Photothermal modulation for oscillating mode atomic force microscopy in solution
3. Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments
4. Tapping mode atomic force microscopy using electrostatic force modulation
5. Force-balancing microforce sensor with an optical-fiber interferometer
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