Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy
Author:
Affiliation:
1. Massachusetts Institute of Technology Mechatronics Research Laboratory,Cambridge,MA,USA,02139
2. Boston College QMLab,Chestnut Hill,MA,USA,02467
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9863218/9863240/09863383.pdf?arnumber=9863383
Reference21 articles.
1. Measuring Boltzmann’s constant with a low-cost atomic force microscope: An undergraduate experiment
2. Understanding interferometry for micro-cantilever displacement detection
3. Cantilever array with optomechanical read-out and integrated actuation for simultaneous high sensitivity force detection
4. Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing
5. Review Article: Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication
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1. AFM SMILER: A Scale Model Interactive Learning Extended Reality Toolkit for Atomic Force Microscopy Created With Digital Twin Technology;IEEE/ASME Transactions on Mechatronics;2023-08
2. Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection;Journal of Visualized Experiments;2023-06-13
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